Advancing Characterization of Materials by Multimodal 4D-STEM Analytical Methods (dummy 41)

About this webinar

Development and production of new materials and semiconductor devices require morphological, structural, and chemical characterization at the nanoscale level to understand their chemico-physical properties and optimize their production process. Besides traditional electron microscopy imaging and compositional analysis techniques, 4D-STEM methods provide additional structural information about the local internal organization of atoms and molecules at each position (pixel) of an acquired STEM map (image). In this webinar, we show how 4D-STEM analytical methods can be used to distinguish the distribution of different materials and phases in alloys, resolve grains and binder distribution in battery electrodes or reveal the architecture of semiconductor devices in unprecedented detail.

We further demonstrate how advanced techniques of electron beam precision and multimodal data acquisition increase the accuracy and throughput of sample analysis. Finally, we present a novel approach to the acquisition and on-the-fly analysis of 4D-STEM measurements using a state-of-the-art analytical STEM microscope which makes the nanoscale characterization of samples amenable to all scientists, engineers, technicians, and students even without expert knowledge of STEM optics or 4D-STEM data analysis and post-processing.